Si-NIR OverLine

Si-NIR OverLine is a contactless FT-NIR spectral sensing device designed for continuous material analysis from a distance without interrupting the production flow.

It provides real-time measurements with built-in self-referencing, enabling reliable monitoring in environments where traditional sampling methods are impractical.

This configuration allows non-intrusive monitoring of materials in motion or when the sensor is mounted on moving equipment.

Key Features & Advantages

• Analysis from a distance without touching the sample

• Continuous operation

• Speedy response

• Built-in self-reference for unmanned calibration

Measurement Mode

Continuous

Sampling Method

Diffuse reflectance

Integration Environments

• Conveyor belts

• Hoppers

• Chutes

• Robots

• Drones

• Moving vehicles

Key Specifications