Si-NIR Matrix DVK
Plug-and-Play Toolkit for Rapid Prototyping and Evaluation
Si-NIR Matrix DVK is a complete development platform enabling evaluation and prototyping of solutions using the Si-NIR Matrix sensor.
Designed for engineers and researchers working with real-world heterogeneous materials, it provides a practical environment for experimentation, testing, and model development.
The kit includes all necessary hardware, accessories, software, and integration tools to support early-stage system integration and development.
Key Features & Advantages
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Wide spectral range
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Large sample coverage
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Dual interface mode for PC or embedded systems
Measurement Mode
Discrete
Sampling Method
Diffuse reflectance. Transflectance can be enabled with an external accessory.
Optical Interface
Built-in light source and collector for large sample coverage (10 mm diameter).
Sample Types
Same as Si-NIR Matrix sensor.
Key Specifications
| Parameter | Value |
|---|---|
| Spectral Range | 1,350 – 2,500 nm |
| SNR | >2,000:1 |
| Resolution | 16 nm |
| Photodetector | Extended InGaAs |
| Connectivity | USB-C, Ethernet |
| Dimensions | 75 × 60 × 80.5 mm |
| Weight | 310 g |
| Software | Si-Spect Software, SDK |