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Si-NIR Matrix DVK

Plug-and-Play Toolkit for Rapid Prototyping and Evaluation

Si-NIR Matrix DVK is a complete development platform enabling evaluation and prototyping of solutions using the Si-NIR Matrix sensor.

Designed for engineers and researchers working with real-world heterogeneous materials, it provides a practical environment for experimentation, testing, and model development.

The kit includes all necessary hardware, accessories, software, and integration tools to support early-stage system integration and development.

Key Features & Advantages

  • Wide spectral range

  • Large sample coverage

  • Dual interface mode for PC or embedded systems

Measurement Mode

Discrete

Sampling Method

Diffuse reflectance. Transflectance can be enabled with an external accessory.

Optical Interface

Built-in light source and collector for large sample coverage (10 mm diameter).

Sample Types

Same as Si-NIR Matrix sensor.

Key Specifications

Parameter Value
Spectral Range 1,350 – 2,500 nm
SNR >2,000:1
Resolution 16 nm
Photodetector Extended InGaAs
Connectivity USB-C, Ethernet
Dimensions 75 × 60 × 80.5 mm
Weight 310 g
Software Si-Spect Software, SDK